Showing posts with label
Charge trapping
.
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Showing posts with label
Charge trapping
.
Show all posts
Apr 25, 2022
[paper] DC, LF noise and TID mechanisms in 16nm FinFETs
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Stefano Bonaldo ab , Teng Ma ab , Serena Mattiazzo bc , Andrea Baschirotto de , Christian Enz f , Daniel M.Fleetwood g , Alessandro Paccagne...
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