Showing posts with label
Back-gate effect
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Showing posts with label
Back-gate effect
.
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Jun 13, 2023
[paper] FDSOI Threshold Voltage Model
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Hung-Chi Han1, (Student, IEEE), Zhixing Zhao2, Steffen Lehmann2, Edoardo Charbon1, (Fellow, IEEE), and Christian Enz1 (Life Fellow, IEEE) No...
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