Showing posts with label
Aging
.
Show all posts
Showing posts with label
Aging
.
Show all posts
May 25, 2021
[papers] Aging and Device Reliability Compact Modeling
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IEEE International Reliability Physics Symposium (IRPS 2021) [1] N. Chatterjee, J. Ortega, I. Meric, P. Xiao and I. Tsameret, "Machine ...
Jan 5, 2021
[paper] Aged MOSFET and Its Compact Modeling
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F. A. Herrera, M. Miura-Mattausch, T. Iizuka, H. Kikuchihara, H. J. Mattausch and H. Takatsuka, Universal Feature of Trap-Density Increase i...
Feb 7, 2017
[paper] Statistical model of the NBTI-induced ΔVth, ΔSS, and Δgm degradations in advanced pFinFETs
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Statistical model of the NBTI induced threshold voltage, subthreshold swing, and transconductance degradations in advanced pFinFETs J. Fra...
Nov 15, 2016
[paper] Analysis of aging effects - From transistor to system level
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Analysis of aging effects - From transistor to system level Maike Taddiken*, Nico Hellwege, Nils Heidmann, Dagmar Peters-Drolshagen, Stef...
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