Showing posts with label
28-nm
.
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Showing posts with label
28-nm
.
Show all posts
Jan 6, 2022
[paper] RTN of a 28-nm Cryogenic MOSFET
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HeeBong Yang, Marcel Robitaille, Xuesong Chen, Hazem Elgabra, Lan Wei, Na Young Kim Random Telegraph Noise of a 28-nm Cryogenic MOSFET in th...
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