[paper] Compact Model for SIS Josephson Junctions

A Compact Model for Superconductor-Insulator-Superconductor (SIS) Josephson Junctions

Shamiul Alam, Mohammad Adnan Jahangir and Ahmedullah Aziz, Member, IEEE

Department of Electrical Engineering and Computer Science

University of Tennessee, Knoxville, TN, USA

in IEEE Electron Device Letters, 

DOI: 10.1109/LED.2020.3002448

Abstract: We present a Verilog-A based compact model for the superconductor-insulator-superconductor (SIS) Josephson junction. The model can generate both hysteretic and non-hysteretic current-voltage (I-V) response for the SIS junctions utilizing the Stewart-McCumber damping parameter. We calibrate our model with different SIS samples and demonstrate accurate matching between the simulated and experimental results. We implement temperature effect on the energy gap and the critical current of the superconductor to explore the dynamic trends in device characteristics. We calculate the junction inductance and stored energy as functions of junction current and temperature. We simulate the read/write operations of an SIS junction based cryogenic memory cell to illustrate the usability of our model.

Fig: (a) Device structure of an SIS Josephson junction
(b) the RCSJ model of a Josephson junction.