#paper: E. A. Gutiérrez-D., J. Méndez-V., J. C. Tinoco, E. T. Rios and O. V. Huerta-G., "DC and 28 GHz Reliability of a SOI FET Technology," in IEEE J-EDS, vol. 8, pp. 385-390, 2020. https://t.co/slotpnOx43 https://t.co/sfZjtH0CPq

#paper: E. A. Gutiérrez-D., J. Méndez-V., J. C. Tinoco, E. T. Rios and O. V. Huerta-G., "DC and 28 GHz Reliability of a SOI FET Technology," in IEEE J-EDS, vol. 8, pp. 385-390, 2020. https://t.co/slotpnOx43

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