#paper Y. Nakamura, N. Kuroda, T. Yanagi, H. Sakairi and K. Nakahara, "High-Voltage and High-Current Id–Vds Measurement Method for Power Transistors Improved by Reducing Self-Heating," in IEEE EDS (Open Access), vol. 41, no. 4, pp. 581-584, April 2020. https://t.co/85eA0jPQKb https://t.co/PT6CUQRELM

#paper Y. Nakamura, N. Kuroda, T. Yanagi, H. Sakairi and K. Nakahara, "High-Voltage and High-Current Id–Vds Measurement Method for Power Transistors Improved by Reducing Self-Heating," in IEEE EDS (Open Access), vol. 41, no. 4, pp. 581-584, April 2020. https://t.co/85eA0jPQKb pic.twitter.com/PT6CUQRELM

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