#paper: L. Yu, J. Ren, X. Lu and X. Wang, "NBTI and HCI Aging Prediction and Reliability Screening During Production Test," in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. doi: 10.1109/TCAD.2019.2961329 https://t.co/JioLMh3YLD https://t.co/s23HnNDOQb

#paper: L. Yu, J. Ren, X. Lu and X. Wang, "NBTI and HCI Aging Prediction and Reliability Screening During Production Test," in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

doi: 10.1109/TCAD.2019.2961329 https://t.co/JioLMh3YLD pic.twitter.com/s23HnNDOQb

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