K.U. Giering et al., "NBTI Degradation and Recovery in Analog Circuits: Accurate and Efficient Circuit-Level Modeling," in IEEE Transactions on Electron Devices, vol. 66, no. 4, pp. 1662-1668, April 2019. doi: 10.1109/TED.2019.2901907 https://t.co/XqBHjwCXXS #paper https://t.co/4oIN7ev19B

K.U. Giering et al., "NBTI Degradation and Recovery in Analog Circuits: Accurate and Efficient Circuit-Level Modeling," in IEEE Transactions on Electron Devices, vol. 66, no. 4, pp. 1662-1668, April 2019.
doi: 10.1109/TED.2019.2901907 https://t.co/XqBHjwCXXS #paper pic.twitter.com/4oIN7ev19B

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