Determination of well flat band condition in thin film FDSOI transistors using C-V measurement for accurate parameter extraction https://t.co/6djtGE7OZV #paper https://t.co/RYLH3fSGhg

Determination of well flat band condition in thin film FDSOI transistors using C-V measurement for accurate parameter extraction https://t.co/6djtGE7OZV #paper http://pic.twitter.com/RYLH3fSGhg

— Wladek Grabinski (@wladek60) November 21, 2017

from Twitter https://twitter.com/wladek60

November 21, 2017 at 11:54PM
via IFTTT