Modeling Early Breakdown Failures of Gate Oxide in SiC Power MOSFETs https://t.co/gwB6cmDMPB #papers #feedly

Modeling Early Breakdown Failures of Gate Oxide in SiC Power MOSFETs https://t.co/gwB6cmDMPB #papers #feedly

— Wladek Grabinski (@wladek60) August 26, 2016

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August 26, 2016 at 12:39PM
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