May 5, 2020
[paper] A Compact Model for SiC Schottky Barrier Diodes Based on the Fundamental Current Mechanisms
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J. R. Nicholls and S. Dimitrijev Queensland Micro- and Nanotechnology Centre School of Engineering and Built Environment Griffith Uni...
[paper] Two Transistors Voltage-Measurement-Based Test Structure for Fast MOSFET Device Mismatch Characterization
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J. P. M. Brito and S. Bampi Two Transistors Voltage-Measurement-Based Test Structure for Fast MOSFET Device Mismatch Characterization ...
[paper] reached 2000 reads at ResearchGate
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Grabiński, Władysław, Daniel Tomaszewski, Laurent Lemaitre, and Andrzej Jakubowski Standardization of the compact model coding: non-full...
[paper] Memory Technology – A Primer for Material Scientists.
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Schenk, Tony, Milan Pesic, Stefan Slesazeck, Uwe Schroeder, and Thomas Mikolajick Memory Technology–A Primer for Material Scientists Re...
May 4, 2020
[paper] Benchmark Tests for MOSFET Thermal Noise Models
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Scholten A.J., Smit G.D.J., Pijper R.M.T., Tiemeijer L.F. Benchmark Tests for MOSFET Thermal Noise Models In: Grasser T. (eds) Noise in...
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