Feb 28, 2018
[paper] Compact electro-thermal modeling of a SiC MOSFET power module under short-circuit conditions
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Proceedings of 43rd Annual Conference of the IEEE Industrial Electronics Society IECON 2017 Lorenzo Ceccarelli, Paula Diaz Reigosa, Ami...
Feb 25, 2018
Call for papers for a Special Issue of IEEE Transactions on Electron Devices on Compact #Modeling for Circuit... https://t.co/N6U0dXHmu1
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Call for papers for a Special Issue of IEEE Transactions on Electron Devices on Compact #Modeling for Circuit... https://t.co/N6U0dXHmu1 ...
Call for papers for a Special Issue of IEEE Transactions on Electron Devices on Compact #Modeling for Circuit Design - IEEE Journals & Magazine https://t.co/MNRwd2XitA
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Call for papers for a Special Issue of IEEE Transactions on Electron Devices on Compact #Modeling for Circuit Design - IEEE Journals &...
Compact #Modeling of Cross-Sectional Scaling in Gate-All-Around FETs: 3-D to 1-D Transition - IEEE Journals &... https://t.co/xp2Ff5Tlcp
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Compact #Modeling of Cross-Sectional Scaling in Gate-All-Around FETs: 3-D to 1-D Transition - IEEE Journals &... https://t.co/xp2Ff5Tl...
Compact #Modeling of Cross-Sectional Scaling in Gate-All-Around FETs: 3-D to 1-D Transition - IEEE Journals & Magazine https://t.co/yTSpsNriwQ
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Compact #Modeling of Cross-Sectional Scaling in Gate-All-Around FETs: 3-D to 1-D Transition - IEEE Journals & Magazine https://t.co/yT...
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