Jul 26, 2017
Analysis of Short-Channel Effects in Junctionless DG MOSFETs #papers https://t.co/P2sqAueamw
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Analysis of Short-Channel Effects in Junctionless DG MOSFETs #papers https://t.co/P2sqAueamw — Wladek Grabinski (@wladek60) July 26, 2017...
[paper] A Compact Model for the Statistics of the Low-Frequency Noise of MOSFETs With Laterally Uniform Doping
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M. Banaszeski da Silva, H. P. Tuinhout, A. Zegers-van Duijnhoven, G. I. Wirth and A. J. Scholten "A Compact Model for the Statistics...
Jul 25, 2017
[paper] Compact On-Wafer Test Structures for Device RF Characterization
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B. Kazemi Esfeh, K. Ben Ali and J. P. Raskin IEEE Fellow Compact On-Wafer Test Structures for Device RF Characterization in IEEE TED, v...
Jul 8, 2017
[mos-ak] [2nd Announcement and Call for Papers] 15th MOS-AK ESSDERC/ESSCIRC Workshop
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MOS-AK ESSDERC/ESSCIRC Workshop http://www.mos-ak.org/leuven_2017/ September 11, 2017 Leuven 2nd Announcement and Call for Papers Together w...
Jul 4, 2017
[paper] A Compact Model for the Statistics of the Low-Frequency Noise of MOSFETs With Laterally Uniform Doping
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A Compact Model for the Statistics of the Low-Frequency Noise of MOSFETs With Laterally Uniform Doping M. Banaszeski da Silva; H. P. Tuin...
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