Time to #OpenSource #Ventilators from Digital and Cyberspace Policy Program and Net Politics https://t.co/yum408VAoo https://t.co/j1ufYLxwAk

Time to #OpenSource #Ventilators
from Digital and Cyberspace Policy Program and Net Politicshttps://t.co/yum408VAoo pic.twitter.com/j1ufYLxwAk

— Wladek Grabinski (@wladek60) April 1, 2020

from Twitter https://twitter.com/wladek60

April 01, 2020 at 08:28PM
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[C4P] ESSDERC TRACK3 Compact Modeling

European ESSDERC/ESSCIRC conference will be organized in Grenoble (F) on Sept.14-18, 2020 with its integral TRACK3: Compact Modeling and Process/Device Simulation which is open for submissions, now. You and all your R&D partners are welcome to submit a modeling paper. The paper submission deadline is April 17, 2020

TRACK3: Compact modeling and process/device simulation (including TCAD and advanced simulation techniques and studies)  focuses on following domains among other R&D topics:

• Compact/SPICE modeling of electronic, optical, organic, and hybrid devices and their IC implementation and interconnection. 
• Verilog-A models of the semiconductor devices (including Bio/Med sensors, MEMS, Microwave, RF, HV and Power, emerging technologies and novel devices)
• Compact/SPICE parameter extraction
• Performance evaluation and open source (FOSS) benchmarking/implementation methodologies
• Modeling of interactions between process, device and circuit design, 
• Foundry/Fabless interface strategies
• Numerical TCAD, analytical, statistical modeling and simulation of electronic, optical and hybrid devices, interconnect, isolation and 2D/3D integration
• Aspects of materials, fabrication processes and devices e.g. advanced physical phenomena (quantum mechanical and non-stationary transport phenomena, ballistic transport, ...)
• Optical, mechanical or electro-thermal modeling and simulation
• DfM, ageing, reliability of materials and devices

Please share our TRACK3 C4P with all your academic and industrial R&D partners active in the compact/SPICE modeling, Verilog-A standardization and TCAD/EDA simulations. Of course, your and your research team proactive contribution to our TRACK3 is more than welcome. I do hope that despite of a last minute notice, with your help, we will be able to draw even more attention to the ESSDERC/ESSCIRC Conference and, in particular, our modeling TRACK3

-- ESSDERC TRACK3 TPC

#paper: Bootsma, G.J., Nordström, H., Eriksson, M. and Jaffray, D.A., 2020. Monte Carlo kilovoltage X-ray tube simulation: A statistical analysis and compact simulation method. Physica Medica, 72, pp.80-87 https://t.co/9C1S4Y3023 https://t.co/D7RzqFb7tP

#paper: Bootsma, G.J., Nordström, H., Eriksson, M. and Jaffray, D.A., 2020. Monte Carlo kilovoltage X-ray tube simulation: A statistical analysis and compact simulation method. Physica Medica, 72, pp.80-87https://t.co/9C1S4Y3023 pic.twitter.com/D7RzqFb7tP

— Wladek Grabinski (@wladek60) March 31, 2020

from Twitter https://twitter.com/wladek60

March 31, 2020 at 09:18PM
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#COVID-19 Related Research and Technologies #Free to Access in #IEEE #Xplore https://t.co/8wtkdHydcI #paper https://t.co/kKCTCwfSCt

#COVID-19 Related Research and Technologies #Free to Access in #IEEE #Xplore https://t.co/8wtkdHydcI#paper pic.twitter.com/kKCTCwfSCt

— Wladek Grabinski (@wladek60) March 31, 2020

from Twitter https://twitter.com/wladek60

March 31, 2020 at 02:50PM
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Professional #Ventilator Design #OpenSource Today by #Medtronic https://t.co/YkzX6fpU80 https://t.co/KA23i6RVDJ

Professional #Ventilator Design #OpenSource Today by #Medtronic https://t.co/YkzX6fpU80 pic.twitter.com/KA23i6RVDJ

— Wladek Grabinski (@wladek60) March 31, 2020

from Twitter https://twitter.com/wladek60

March 31, 2020 at 11:01AM
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#paper: N. Zagni et al. "Systematic Modeling of Electrostatics, Transport, and Statistical Variability Effects of Interface Traps in End-of-the-Roadmap III–V MOSFETs," in IEEE TED, vol. 67, no. 4, pp. 1560-1566, April 2020. https://t.co/wtk1U4sFuB https://t.co/xWzZ5GnQal

#paper: N. Zagni et al. "Systematic Modeling of Electrostatics, Transport, and Statistical Variability Effects of Interface Traps in End-of-the-Roadmap III–V MOSFETs," in IEEE TED, vol. 67, no. 4, pp. 1560-1566, April 2020. https://t.co/wtk1U4sFuB pic.twitter.com/xWzZ5GnQal

— Wladek Grabinski (@wladek60) March 30, 2020

from Twitter https://twitter.com/wladek60

March 30, 2020 at 05:01PM
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#paper: X. Li, T. Pu, L. Li and J. Ao, "Enhanced Sensitivity of GaN-Based Temperature Sensor by Using the Series Schottky Barrier Diode Structure," in IEEE EDL, vol. 41, no. 4, pp. 601-604, April 2020 https://t.co/koGfb8GeST https://t.co/LCE1l2wdly

#paper: X. Li, T. Pu, L. Li and J. Ao, "Enhanced Sensitivity of GaN-Based Temperature Sensor by Using the Series Schottky Barrier Diode Structure," in IEEE EDL, vol. 41, no. 4, pp. 601-604, April 2020https://t.co/koGfb8GeST pic.twitter.com/LCE1l2wdly

— Wladek Grabinski (@wladek60) March 30, 2020

from Twitter https://twitter.com/wladek60

March 30, 2020 at 11:14AM
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