Mar 5, 2020

#DATE 2020 in Grenoble replaced by a virtual conference that will be scheduled in the coming weeks https://t.co/vwd8IZqhPo #paper https://t.co/FNMBVw2LUl


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March 05, 2020 at 03:30PM
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#EDTM 2020 Conference going Virtual -The conference will be held as a Virtual conference with all presentations be posted online. -The pre-conference Tutorials and Short Courses on March 15th, 2020 is cancelled https://t.co/x9cC8kKu6D #paper https://t.co/M8C5uO6DQY


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March 05, 2020 at 03:24PM
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Mar 4, 2020

#paper: Krishna Pradeep, Patrick Scheer, Thierry Poiroux, André Juge and Gerard Ghibaudo; In-Wafer variability in FD-SOI MOSFETs: Detailed analysis and statistical modelling" Accepted Manuscript online 27 February 2020 by IOP Publishing Ltd https://t.co/rEjVnoRLuH https://t.co/V98FnxCpeo


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March 04, 2020 at 02:51PM
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#paper #PhD: Michael Kollmitzer: Modeling of reverse current effects in trench-based smart power technologies. Gottfried Wilhelm Leibniz Universität, Diss., 2019, viii, 141 S. DOI: https://t.co/Uz3n1mRzzt https://t.co/mbBC0FR04m https://t.co/CVFveW4DXr


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March 04, 2020 at 02:34PM
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Mar 3, 2020

#paper: S. Rhee et al. "Extension of the DG Model to the Second-Order Quantum Correction for Analysis of the Single-Charge Effect in Sub-10-nm MOS Devices," in IEEE JEDS, vol. 8, pp. 213-222, 2020 doi: 10.1109/JEDS.2020.2971426 https://t.co/LhdoMi9pP3 https://t.co/YgUVWiBxlv


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March 03, 2020 at 08:23AM
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Mar 2, 2020

“It is predicted that in 2030 transistors will be a sixth smaller" by Stephen Crosher https://t.co/ErClcb0e2R #paper https://t.co/PuTy7flK9O


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March 02, 2020 at 08:42AM
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#paper: A. Debnath, N. DasGupta and A. DasGupta, "Charge-Based Compact Model of Gate Leakage Current for AlInN/GaN and AlGaN/GaN HEMTs," in IEEE TED, vol. 67, no. 3, pp. 834-840, March 2020 doi: 10.1109/TED.2020.2965561 https://t.co/2HcKKjKOqE https://t.co/m6cKvAatEC


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March 02, 2020 at 08:29AM
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