#IBM’s #OpenSource POWER Play: A #RISC-V Business? https://t.co/11lFmDgnpU https://t.co/io81PcbNqh

#IBM’s #OpenSource POWER Play: A #RISC-V Business? https://t.co/11lFmDgnpU pic.twitter.com/io81PcbNqh

— Wladek Grabinski (@wladek60) August 28, 2019

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August 28, 2019 at 04:11PM
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F. Ávila Herrera et al., "Advanced Short-Channel-Effect Modeling With Applicability to Device Optimization—Potentials and Scaling," in IEEE Transactions on Electron Devices, vol. 66, no. 9, pp. 3726-3733, Sept. 2019 https://t.co/6vkIpdH9F6 #paper https://t.co/sVWISPjNKN

F. Ávila Herrera et al., "Advanced Short-Channel-Effect Modeling With Applicability to Device Optimization—Potentials and Scaling," in IEEE Transactions on Electron Devices, vol. 66, no. 9, pp. 3726-3733, Sept. 2019 https://t.co/6vkIpdH9F6 #paper pic.twitter.com/sVWISPjNKN

— Wladek Grabinski (@wladek60) August 28, 2019

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August 28, 2019 at 05:14PM
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3rd International Workshop on MEMS and Sensor System 2019 (#IWMS 2019) Aug. 27-29 Hi Chi Minh City (VN) https://t.co/hOnegKRO5E #paper https://t.co/fPmyokXQ5w

3rd International Workshop on MEMS and Sensor System 2019 (#IWMS 2019) Aug. 27-29 Hi Chi Minh City (VN) https://t.co/hOnegKRO5E #paper pic.twitter.com/fPmyokXQ5w

— Wladek Grabinski (@wladek60) August 27, 2019

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August 27, 2019 at 05:11PM
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Is the Threat of ‘Fake Science’ Real? "Thinking ahead to the potential for fake science can better equip research institutions to respond to targeted disinformation while preserving an open scientific community." https://t.co/nzAokiqybW #paper https://t.co/D0WasFZRwv

Is the Threat of ‘Fake Science’ Real?

"Thinking ahead to the potential for fake science can better equip research institutions to respond to targeted disinformation while preserving an open scientific community."https://t.co/nzAokiqybW #paper pic.twitter.com/D0WasFZRwv

— Wladek Grabinski (@wladek60) August 27, 2019

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August 27, 2019 at 02:31PM
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Y. Yamamoto et al., "The Study of Plasma Induced Damage on 65-nm Silicon on Thin BOX Transistor," in IEEE Journal of the Electron Devices Society, vol. 7, pp. 825-828, 2019 https://t.co/ppz92LZnNi #paper https://t.co/7hmMCY5rvx

Y. Yamamoto et al., "The Study of Plasma Induced Damage on 65-nm Silicon on Thin BOX Transistor," in IEEE Journal of the Electron Devices Society, vol. 7, pp. 825-828, 2019https://t.co/ppz92LZnNi #paper pic.twitter.com/7hmMCY5rvx

— Wladek Grabinski (@wladek60) August 27, 2019

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August 27, 2019 at 11:58AM
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B. K. Esfeh, V. Kilchytska, N. Planes, M. Haond, D. Flandre and J. Raskin, "28-nm FDSOI nMOSFET RF Figures of Merits and Parasitic Elements Extraction at Cryogenic Temperature Down to 77 K," in IEEE JEDS, vol. 7, pp. 810-816, 2019. https://t.co/VXOuHjBAWI #paper https://t.co/mT1vV0psze

B. K. Esfeh, V. Kilchytska, N. Planes, M. Haond, D. Flandre and J. Raskin, "28-nm FDSOI nMOSFET RF Figures of Merits and Parasitic Elements Extraction at Cryogenic Temperature Down to 77 K," in IEEE JEDS, vol. 7, pp. 810-816, 2019.
https://t.co/VXOuHjBAWI #paper pic.twitter.com/mT1vV0psze

— Wladek Grabinski (@wladek60) August 27, 2019

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August 27, 2019 at 09:54AM
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低频噪声测试在新兴半导体材料和器件物理机制探索的应用研究 Application Research of Low Frequency Noise Testing in the Exploration of Emerging Semiconductor Materials and Devices Physical Mechanism https://t.co/Y9lDjd1kPn #paper https://t.co/6X4218ejOF

低频噪声测试在新兴半导体材料和器件物理机制探索的应用研究
Application Research of Low Frequency Noise Testing in the Exploration of Emerging Semiconductor Materials and Devices Physical Mechanismhttps://t.co/Y9lDjd1kPn #paper pic.twitter.com/6X4218ejOF

— Wladek Grabinski (@wladek60) August 27, 2019

from Twitter https://twitter.com/wladek60

August 27, 2019 at 09:15AM
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