Apr 30, 2019

Apr 29, 2019

P. Kushwaha et al., "Characterization and Modeling of Flicker #Noise in #FinFETs at Advanced Technology Node," in IEEE Electron Device Letters. doi: 10.1109/LED.2019.2911614 https://t.co/RuzIYlIOiL #paper https://t.co/y7lpjHI02W


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April 29, 2019 at 09:32AM
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Apr 26, 2019

A Compact Model for Border Traps in Lateral MOS Devices with Large Channel Resistance https://t.co/p9sOA4A8Ee #paper


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April 26, 2019 at 09:14PM
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A Quick #TSMC 2019 Tech Symposium Overview #FinFET https://t.co/NzINOJTciz #paper


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April 26, 2019 at 02:29PM
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Apr 25, 2019

H. Cortes-Ordonez, S. Jacob, F. Mohamed, G. Ghibaudo and B. Iniguez, "Analysis and Compact Modeling of Gate Capacitance in Organic Thin-Film Transistors," in IEEE Transactions on Electron Devices, vol. 66, no. 5, pp. 2370-2374, May 2019. https://t.co/IHtWBBiqiI #paper https://t.co/Ryp6FJ6TlS


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April 25, 2019 at 09:34PM
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#Emerging #memories https://t.co/Iv50OpzJGO #paper


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April 25, 2019 at 07:20AM
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